DocumentCode
2821
Title
Using
-Based Plasma to Modify Wet-Etching Pattern Sapphire Substrate for Improving the Growth of GaN-Based LEDs
Author
Bo-Wen Lin ; Chen-Yi Niu ; Cheng-Yu Hsieh ; Bau-Ming Wang ; Wen-Ching Hsu ; Ray-Ming Lin ; Wu, Y.C.S.
Author_Institution
Mater. Sci. & Eng. Dept., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
25
Issue
4
fYear
2013
fDate
Feb.15, 2013
Firstpage
371
Lastpage
373
Abstract
Wet-etching pattern sapphire substrates (PSS) have been used to grow GaN-based light-emitting diodes (LEDs). However, after wet etching, several sidewall facets are exposed on the patterns of PSS. These sidewall facets would grow zincblende GaN and form irregular voids. In this letter, BCl3-based plasma is used to solve this problem and improve the performance of GaN-based LEDs.
Keywords
III-V semiconductors; gallium compounds; light emitting diodes; sputter etching; voids (solid); wide band gap semiconductors; Al2O3; BCl3-based plasma; GaN; GaN-based LED; GaN-based light-emitting diodes; PSS; sidewall facets; voids; wet-etching pattern sapphire substrate; zincblende GaN; Etching; Gallium nitride; Light emitting diodes; Nanoscale devices; Plasmas; Substrates; ${rm BCl}_{3}$ ; light-emitting diode (LED); pattern; sapphire;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2013.2238226
Filename
6407764
Link To Document