DocumentCode :
2821
Title :
Using {\\rm BCl}_{3} -Based Plasma to Modify Wet-Etching Pattern Sapphire Substrate for Improving the Growth of GaN-Based LEDs
Author :
Bo-Wen Lin ; Chen-Yi Niu ; Cheng-Yu Hsieh ; Bau-Ming Wang ; Wen-Ching Hsu ; Ray-Ming Lin ; Wu, Y.C.S.
Author_Institution :
Mater. Sci. & Eng. Dept., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
25
Issue :
4
fYear :
2013
fDate :
Feb.15, 2013
Firstpage :
371
Lastpage :
373
Abstract :
Wet-etching pattern sapphire substrates (PSS) have been used to grow GaN-based light-emitting diodes (LEDs). However, after wet etching, several sidewall facets are exposed on the patterns of PSS. These sidewall facets would grow zincblende GaN and form irregular voids. In this letter, BCl3-based plasma is used to solve this problem and improve the performance of GaN-based LEDs.
Keywords :
III-V semiconductors; gallium compounds; light emitting diodes; sputter etching; voids (solid); wide band gap semiconductors; Al2O3; BCl3-based plasma; GaN; GaN-based LED; GaN-based light-emitting diodes; PSS; sidewall facets; voids; wet-etching pattern sapphire substrate; zincblende GaN; Etching; Gallium nitride; Light emitting diodes; Nanoscale devices; Plasmas; Substrates; ${rm BCl}_{3}$; light-emitting diode (LED); pattern; sapphire;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2013.2238226
Filename :
6407764
Link To Document :
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