DocumentCode :
2821004
Title :
Authors index
fYear :
2010
fDate :
26-29 April 2010
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location :
Hsin Chu
Print_ISBN :
978-1-4244-5269-9
Electronic_ISBN :
978-1-4244-5271-2
Type :
conf
DOI :
10.1109/VDAT.2010.5496764
Filename :
5496764
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2821004