• DocumentCode
    2821164
  • Title

    A low-noise conductivity microstructure instrument

  • Author

    Meagher, T. ; Pederson, A. ; Gregg, Melissa

  • Author_Institution
    Univ. of Washington, Seattle, WA, USA
  • fYear
    1982
  • fDate
    20-22 Sept. 1982
  • Firstpage
    283
  • Lastpage
    290
  • Abstract
    In rapid sampling of oceanic scalar microstructure, conductivity measurement offers advantages over temperature measurement in that conductivity probes can be designed to have fixed, free-flushing sample volumes, and their response is not limited by thermal diffusion times (an inherent problem with temperature sensors). Development of a "dual-needle" microstructure conductivity instrument is described, from its first use as a reference cell on a dynamic sensor calibration facility (salt-stratified tank) to more recent modifications and use in the open ocean. The cell used in the ocean had a centimeter-scale spatial resolution, compared with the millimeter-scale resolution achieved with the smaller version used in the stratified tank. An rms noise level of 1 \\times 10^{-6} s/m was achieved over a 1 to 100 Hz bandwidth (which at constant salinity corresponds to an equivalent rms temperature noise of 10 microdegrees C).
  • Keywords
    Conductivity measurement; Instruments; Microstructure; Noise level; Oceans; Probes; Sampling methods; Spatial resolution; Temperature measurement; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    OCEANS 82
  • Conference_Location
    Washington, DC, USA
  • Type

    conf

  • DOI
    10.1109/OCEANS.1982.1151743
  • Filename
    1151743