DocumentCode
2821164
Title
A low-noise conductivity microstructure instrument
Author
Meagher, T. ; Pederson, A. ; Gregg, Melissa
Author_Institution
Univ. of Washington, Seattle, WA, USA
fYear
1982
fDate
20-22 Sept. 1982
Firstpage
283
Lastpage
290
Abstract
In rapid sampling of oceanic scalar microstructure, conductivity measurement offers advantages over temperature measurement in that conductivity probes can be designed to have fixed, free-flushing sample volumes, and their response is not limited by thermal diffusion times (an inherent problem with temperature sensors). Development of a "dual-needle" microstructure conductivity instrument is described, from its first use as a reference cell on a dynamic sensor calibration facility (salt-stratified tank) to more recent modifications and use in the open ocean. The cell used in the ocean had a centimeter-scale spatial resolution, compared with the millimeter-scale resolution achieved with the smaller version used in the stratified tank. An rms noise level of
s/m was achieved over a 1 to 100 Hz bandwidth (which at constant salinity corresponds to an equivalent rms temperature noise of 10 microdegrees C).
s/m was achieved over a 1 to 100 Hz bandwidth (which at constant salinity corresponds to an equivalent rms temperature noise of 10 microdegrees C).Keywords
Conductivity measurement; Instruments; Microstructure; Noise level; Oceans; Probes; Sampling methods; Spatial resolution; Temperature measurement; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
OCEANS 82
Conference_Location
Washington, DC, USA
Type
conf
DOI
10.1109/OCEANS.1982.1151743
Filename
1151743
Link To Document