• DocumentCode
    2821896
  • Title

    Quantitative and qualitative evaluations of image enhancement techniques

  • Author

    Moustaf, M.A.A. ; Ismaiel, Hanafy M.

  • Author_Institution
    Arab Acad. of Sci. & Technol. & Maritime Transp., Cairo
  • Volume
    2
  • fYear
    2003
  • fDate
    30-30 Dec. 2003
  • Firstpage
    664
  • Abstract
    Due to the growing demand to obtain information about the structure, therefore the importance of digital image processing (DIP) takes place to improve the quality of the photographic image. Several types of image enhancement techniques took place in order to improve the quality of the corrupted images. Unfortunately, these techniques suffer from the inability of keeping fine details although they have good performance when dealing with images corrupted with low percentage of noise. In this paper, a comparative study on traditional techniques in both spatial and frequency domains with self-organizing artificial neural networks (ANN) techniques for recovering images corrupted with different percentages of impulse noise 10%-90%. From the simulation results, it was clear that the performance of a self organizing artificial neural networks technique is better than the traditional techniques in both spatial and frequency domain when dealing with noise ratios 30%-40%. In addition to the ability of self-organizing ANN techniques to recover images corrupted with higher noise ratios when using higher mask sizes
  • Keywords
    image denoising; image enhancement; impulse noise; neural nets; corrupted images; digital image processing; fine details; frequency domain; image enhancement; image recovery; impulse noise; mask size; noise ratio; photographic image; self-organizing artificial neural networks; spatial domain; Artificial neural networks; Band pass filters; Displays; Filtering; Finite impulse response filter; Frequency domain analysis; Image analysis; Image edge detection; Image enhancement; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2003 IEEE 46th Midwest Symposium on
  • Conference_Location
    Cairo
  • ISSN
    1548-3746
  • Print_ISBN
    0-7803-8294-3
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2003.1562374
  • Filename
    1562374