مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2822012

Title :

Author index

fYear :

1999

fDate :

18-18 March 1999

Firstpage :

233

Lastpage :

234

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Microelectronic Test Structures, 1999. ICMTS 1999. Proceedings of the 1999 International Conference on

Conference_Location :

Goteborg, Sweden

Print_ISBN :

0-7803-5270-X

Type :

conf

DOI :

10.1109/ICMTS.1999.766250

Filename :

766250

Link To Document :