Title :
A new yield optimization algorithm and its applications
Author :
Wang, Zhihua ; Yang, Huazhong ; Liu, RenSheng ; Fan, Chongzhi
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
Abstract :
The authors propose a novel yield optimization algorithm for IC design. To design a practical yield optimization system, two efforts must be made. One is to get a suitable convergence criterion, the other is to propose an efficient optimization method, by which one can reach the maximum yield point as soon as possible. A convergence criterion based on sequential tests of a hypothesis is presented. This algorithm was implemented in a CADS (computer-aided design system). Applications of this algorithm show its high efficiency
Keywords :
circuit CAD; circuit layout CAD; electronic engineering computing; integrated circuit manufacture; optimisation; CADS; IC design; computer-aided design system; convergence criterion; optimization method; sequential tests; yield optimization algorithm; Algorithm design and analysis; Application software; Circuits; Convergence; Design automation; Design engineering; Design optimization; Equations; Optimization methods; Yield estimation;
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
DOI :
10.1109/ISCAS.1991.176055
