Title :
IEE Colloquium on `Algorithmic and Knowledge Based CAD for VLSI´ (Digest No.125)
Abstract :
The following topics were dealt with: VLSI; circuit layout CAD; design for testability; knowledge based CAD; IC testing; digital IC design; analogue IC design and circuit verification
Keywords :
VLSI; circuit layout CAD; digital integrated circuits; integrated circuit testing; knowledge based systems; linear integrated circuits; IC testing; VLSI; analogue IC design; circuit layout CAD; circuit verification; design for testability; digital IC design; knowledge based CAD;
Conference_Titel :
Algorithmic and Knowledge Based CAD for VLSI, IEE Colloquium on
Conference_Location :
London
