DocumentCode
282272
Title
IEE Colloquium on `Algorithmic and Knowledge Based CAD for VLSI´ (Digest No.125)
fYear
1989
fDate
32818
Abstract
The following topics were dealt with: VLSI; circuit layout CAD; design for testability; knowledge based CAD; IC testing; digital IC design; analogue IC design and circuit verification
Keywords
VLSI; circuit layout CAD; digital integrated circuits; integrated circuit testing; knowledge based systems; linear integrated circuits; IC testing; VLSI; analogue IC design; circuit layout CAD; circuit verification; design for testability; digital IC design; knowledge based CAD;
fLanguage
English
Publisher
iet
Conference_Titel
Algorithmic and Knowledge Based CAD for VLSI, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
198934
Link To Document