Title :
ZnO based SAW delay line sensor: fabrication and characteristics
Author :
Hassani, Farid ; Ahmadi, Shahrokh ; Korman, Can E. ; Zaghloul, Mona E.
Author_Institution :
Dept. of Electr. & Comput. Eng., George Washington Univ., DC, USA
Abstract :
ZnO, a well-known piezoelectric material, is used to develop micro-scale surface acoustic wave (SAW) delay line sensor. In this work, SAW delay line sensors are fabricated employing ZnO films that are deposited by RF sputtering technique. Films are characterized prior to device fabrication by X-ray diffraction (XRD) for film crystalline quality, UV-visible transmission spectroscopy for optical characteristics, and atomic force microscopy (AFM) for surface morphology. Interdigital electrodes producing surface acoustic waves in the hundreds of MHz are developed by photolithography and metallization techniques. SAW delay line sensor device testing, measurement and characteristics on RF sputtered ZnO films are presented and compared.
Keywords :
X-ray diffraction; atomic force microscopy; metallisation; photolithography; piezoelectric materials; sputter deposition; surface acoustic wave delay lines; surface acoustic wave sensors; surface morphology; thin films; ultraviolet spectroscopy; zinc compounds; AFM; RF sputtering technique; SAW delay line sensor; UV-visible transmission spectroscopy; X-ray diffraction; XRD; ZnO; atomic force microscopy; film crystalline quality; interdigital electrode; metallization technique; micro-scale surface acoustic wave delay line sensor; optical characteristic; photolithography; piezoelectric material; surface morphology; Acoustic sensors; Delay lines; Fabrication; Optical films; Optical surface waves; Sensor phenomena and characterization; Surface acoustic wave devices; Surface acoustic waves; Surface morphology; Zinc oxide;
Conference_Titel :
Circuits and Systems, 2003 IEEE 46th Midwest Symposium on
Print_ISBN :
0-7803-8294-3
DOI :
10.1109/MWSCAS.2003.1562429