Title :
Stability properties of integration methods in SPICE transient analysis
Author :
Gubian, Paolo ; Zanella, Marina
Author_Institution :
Dipartimento di Automazione Ind., Brescia Univ., Italy
Abstract :
Experimental evidence shows that the usage of MOS transistor charge-control models in the SPICE circuit simulator may cause trouble in transient analysis, independent of the dimensions of the circuits. If the trapezoidal integration method is adopted for the branch currents´ computation of an MOS circuit in transient analysis, the solution sometimes oscillates indefinitely, alternating a positive error and a negative error at each SPICE internal time point. Device models and numerical algorithms have been taken into account in order to determine the causes of this behavior. The trapezoidal method has been identified as the main factor responsible for wrong outputs while Gear methods recover from errors in a finite number of steps
Keywords :
circuit analysis computing; field effect transistor circuits; integration; numerical methods; semiconductor device models; stability; transients; Gear methods; MOS circuit; MOS transistor charge-control models; SPICE circuit simulator; SPICE transient analysis; negative error; numerical algorithms; positive error; trapezoidal integration; Analytical models; Circuit analysis computing; Circuit simulation; Circuit stability; Computational modeling; Gears; MOSFETs; Numerical models; SPICE; Transient analysis;
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
DOI :
10.1109/ISCAS.1991.176103
