• DocumentCode
    2823057
  • Title

    Variability analysis of a digitally trimmable ultra-low power voltage reference

  • Author

    Seok, Mingoo ; Kim, Gyouho ; Blaauw, David ; Sylvester, Dennis

  • Author_Institution
    EECS, Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2010
  • fDate
    14-16 Sept. 2010
  • Firstpage
    110
  • Lastpage
    113
  • Abstract
    A digitally trimmable voltage reference is proposed, achieving a tight distribution of temperature coefficient and output voltage, along with pA-range current consumption for Vdd=0.5-3.0V. Using 2 temperature point digital trimming, the temperature coefficient and nominal output voltage are within 5.3-47.4ppm/°C and 175.2-176.5mV across 25 dies in 0.13μm CMOS. Non-trimmable versions are also implemented in 0.13μm and 0.18μm technologies to study process variations across multiple runs and technology portability of the design.
  • Keywords
    CMOS integrated circuits; low-power electronics; 2 temperature point digital trimming; CMOS; digitally trimmable ultra-low power voltage reference; nominal output voltage; pA-range current consumption; size 0.13 mum; temperature coefficient; variability analysis; voltage 0.5 V to 3 V; voltage 175.2 mV to 176.5 mV; Biomedical measurements; CMOS integrated circuits; Capacitors; Noise; Power measurement; Temperature measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC, 2010 Proceedings of the
  • Conference_Location
    Seville
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4244-6662-7
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2010.5619816
  • Filename
    5619816
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2823057