DocumentCode :
2823127
Title :
Ion track lithography: novel low-cost process to form deep vertical and high aspect ratio MEMS in flexible laminates
Author :
Majjad, H. ; Lindeberg, M. ; Skupinski, M. ; Hjort, K.
Author_Institution :
Angstrom Lab., Uppsala Univ., Sweden
fYear :
2003
fDate :
5-7 May 2003
Firstpage :
318
Lastpage :
323
Abstract :
High aspect ratio microstructures are today of utterly importance in MEMS. The process described in this paper can be used to produce deep, vertical microstructures in polyimide based materials, used in e.g. flexible printed circuit boards (FPCBs). Stacked polyimide and metal layers have the potential of integrating microelectronic circuits with above applications. The process is capable of producing regions with perpendicular sub-micron metal wire connections at numerous, arbitrarily specified locations. The flexible laminate is irradiated with heavy ions creating a vertical damage anisotropy (ion tracks) in the polymer layer. Lithographically defined apertures in the metallic layer define the geometry. The tracks exposed are selectively developed forming nanometer-wide pores. Metallic structures have been replicated in these pores by electrodeposition of metals. Demonstrator microstructures and highly vertical, through hole microvias have been fabricated. Ion track technology is promising for ultra-high density via batch production and has a potential of further miniaturizing via dimensions.
Keywords :
crystal microstructure; electrodeposition; integrated circuits; ion beam effects; ion beam lithography; laminates; micromechanical devices; polymer structure; polymers; printed circuits; MEMS; damage anisotropy; electrodeposition; flexible laminates; flexible printed circuit boards; integrating microelectronic circuits; ion beam effects; ion track lithography; metal layers; microstructures; polyimide based materials; stacked polyimide; submicron metal wire connections; Anisotropic magnetoresistance; Flexible printed circuits; Laminates; Lithography; Microelectronics; Micromechanical devices; Microstructure; Polyimides; Polymers; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS 2003. Symposium on
Print_ISBN :
0-7803-7066-X
Type :
conf
DOI :
10.1109/DTIP.2003.1287060
Filename :
1287060
Link To Document :
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