DocumentCode :
282350
Title :
ASM driven test vector generation
Author :
Walker, C.E. ; King, P.J. ; Gill, K.N.
Author_Institution :
Staffordshire Polytech., Stafford, UK
fYear :
1989
fDate :
32839
Firstpage :
42461
Lastpage :
411
Abstract :
This paper discusses the automatic test modules of the Digital Design Studio. The main aim of this project funded under the NAB special initiatives in engineering design is to develop integrated engineering design facilities, exploiting expert system and database techniques with appropriate graphical interfaces used to improve the human-computer interface. This work is a collaborative venture at Staffordshire Polytechnic between the departments of Computing and Electrical and Electronic Engineering
Keywords :
automatic test equipment; circuit CAD; digital integrated circuits; expert systems; Digital Design Studio; NAB special initiatives; automatic test modules; database techniques; expert system; graphical interfaces; human-computer interface; integrated engineering design facilities; test vector generation;
fLanguage :
English
Publisher :
iet
Conference_Titel :
New Directions in VLSI Design, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
199046
Link To Document :
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