DocumentCode
282350
Title
ASM driven test vector generation
Author
Walker, C.E. ; King, P.J. ; Gill, K.N.
Author_Institution
Staffordshire Polytech., Stafford, UK
fYear
1989
fDate
32839
Firstpage
42461
Lastpage
411
Abstract
This paper discusses the automatic test modules of the Digital Design Studio. The main aim of this project funded under the NAB special initiatives in engineering design is to develop integrated engineering design facilities, exploiting expert system and database techniques with appropriate graphical interfaces used to improve the human-computer interface. This work is a collaborative venture at Staffordshire Polytechnic between the departments of Computing and Electrical and Electronic Engineering
Keywords
automatic test equipment; circuit CAD; digital integrated circuits; expert systems; Digital Design Studio; NAB special initiatives; automatic test modules; database techniques; expert system; graphical interfaces; human-computer interface; integrated engineering design facilities; test vector generation;
fLanguage
English
Publisher
iet
Conference_Titel
New Directions in VLSI Design, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
199046
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