Title :
The effect of lapping method on the thermal reliability of a GMR head based on Black´s equation
Author :
Yufeng Li ; Meyer, D.
Author_Institution :
Read-Rite Corp., Milpitas, CA, USA
Abstract :
The thermal reliability of a GMR head is described by Black´s equation. In this paper the temperature of a GMRE is studied as a function of lapping process and bias current for two different lapping techniques used for stripe height control: electrical lapping guide and magnetic device resistance. Based on measurements of the electric resistance, it is found that the temperature rise is proportional to the square of electric current density, not to the power consumption as conventionally perceived.
Keywords :
giant magnetoresistance; magnetic heads; magnetoresistive devices; reliability; Black equation; GMR head; GMRE; bias current; electric resistance; electrical lapping guide; lapping method; magnetic device resistance; stripe height control; thermal reliability; Current measurement; Density measurement; Electric resistance; Electrical resistance measurement; Equations; Lapping; Magnetic devices; Magnetic heads; Power measurement; Temperature control;
Conference_Titel :
Asia-Pacific Magnetic Recording Conference, 2000. APMRC 2000
Conference_Location :
Tokyo, Japan
Print_ISBN :
0-7803-6254-3
DOI :
10.1109/APMRC.2000.898939
