Title :
A 500 mV 650 pW random number generator in 130 nm CMOS for a UWB localization system
Author :
De Roover, Christophe ; Steyaert, Michiel
Author_Institution :
Dept. of Electr. Eng., Katholieke Univ. Leuven, Heverlee, Belgium
Abstract :
This paper presents an ultra low power random number generator (RNG) for a UWB RFID and Localization system. It amplifies noise by using a chain of identical inverters to generate a serial output stream of random bits. The circuit consumes only 0.65nW from a supply voltage VDD = 0.5V. The degree of randomness of the output bitstream is examined with the NIST tests.
Keywords :
CMOS integrated circuits; radiofrequency identification; random number generation; ultra wideband technology; CMOS; NIST tests; UWB RFID; UWB localization system; power 650 pW; size 130 nm; ultra low power random number generator; voltage 500 mV; Antennas; Generators; Inverters; Low power electronics; Noise; Technical Activities Guide - TAG; Transistors;
Conference_Titel :
ESSCIRC, 2010 Proceedings of the
Conference_Location :
Seville
Print_ISBN :
978-1-4244-6662-7
DOI :
10.1109/ESSCIRC.2010.5619875
