Time-to-digital converter based on time difference amplifier with non-linearity calibration

Author

Mandai, Shingo ; Iizuka, Tetsuya ; Nakura, Toru ; Ikeda, Makoto ; Asada, Kunihiro

Author_Institution

Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan

fYear

2010

fDate

14-16 Sept. 2010

Firstpage

266

Lastpage

269

Abstract

This paper proposes a time-to-digital converter (TDC) utilizing the cascaded time difference amplifier(TDA) and shows measurement results with 0.18um CMOS. The proposed TDC operates in two modes, a wide input range mode and a fine time resolution mode. We employ a non-linearity calibration technique based on lookup table. The wide input range mode shows 10.2ps time resolution over 1.3ns input range with DNL and INL of +0.8/-0.7LSB and +0.8/-0.4LSB, respectively. The fine time resolution mode shows 1.0ps time resolution over 60ps input range with DNL and INL of +0.9/-0.9LSB and +0.8/-1.0LSB, respectively.

Keywords

CMOS analogue integrated circuits; analogue-digital conversion; differential amplifiers; table lookup; CMOS; cascaded time difference amplifier; fine time resolution mode; lookup table; nonlinearity calibration; size 0.18 mum; time-to-digital converter; wide input range mode; CMOS integrated circuits; Converters; Delay; Gain control; Linearity; Signal resolution; Table lookup;

fLanguage

English

Publisher

ieee

Conference_Titel

ESSCIRC, 2010 Proceedings of the

Conference_Location

Seville

ISSN

1930-8833

Print_ISBN

978-1-4244-6662-7

Type

conf

DOI

10.1109/ESSCIRC.2010.5619878

Filename

5619878