DocumentCode :
2824246
Title :
Time-to-digital converter based on time difference amplifier with non-linearity calibration
Author :
Mandai, Shingo ; Iizuka, Tetsuya ; Nakura, Toru ; Ikeda, Makoto ; Asada, Kunihiro
Author_Institution :
Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
fYear :
2010
fDate :
14-16 Sept. 2010
Firstpage :
266
Lastpage :
269
Abstract :
This paper proposes a time-to-digital converter (TDC) utilizing the cascaded time difference amplifier(TDA) and shows measurement results with 0.18um CMOS. The proposed TDC operates in two modes, a wide input range mode and a fine time resolution mode. We employ a non-linearity calibration technique based on lookup table. The wide input range mode shows 10.2ps time resolution over 1.3ns input range with DNL and INL of +0.8/-0.7LSB and +0.8/-0.4LSB, respectively. The fine time resolution mode shows 1.0ps time resolution over 60ps input range with DNL and INL of +0.9/-0.9LSB and +0.8/-1.0LSB, respectively.
Keywords :
CMOS analogue integrated circuits; analogue-digital conversion; differential amplifiers; table lookup; CMOS; cascaded time difference amplifier; fine time resolution mode; lookup table; nonlinearity calibration; size 0.18 mum; time-to-digital converter; wide input range mode; CMOS integrated circuits; Converters; Delay; Gain control; Linearity; Signal resolution; Table lookup;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ESSCIRC, 2010 Proceedings of the
Conference_Location :
Seville
ISSN :
1930-8833
Print_ISBN :
978-1-4244-6662-7
Type :
conf
DOI :
10.1109/ESSCIRC.2010.5619878
Filename :
5619878
Link To Document :
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