Title :
Self-heating based model for polysilicon resistors
Author :
Tatinian, William ; Simoen, Eddy ; Ouassif, Nordin ; Desoete, Bart ; Gillon, Renaud ; Pannier, Philippe
Author_Institution :
AMI Semicond., Oudenaarde, Belgium
Abstract :
This paper proposes a physical model for poly resistors including a methodology for the determination of the corner models based on the self heating of the device. The thermal resistance can easily be extracted from DC and temperature measurements. This model allows to get rid of the commonly used voltage coefficients.
Keywords :
resistors; semiconductor device models; polysilicon resistors; self-heating based model; thermal resistance; Ambient intelligence; Circuits; Electric resistance; Heating; Resistors; Surface resistance; Temperature dependence; Temperature measurement; Thermal resistance; Voltage;
Conference_Titel :
Circuits and Systems, 2003 IEEE 46th Midwest Symposium on
Print_ISBN :
0-7803-8294-3
DOI :
10.1109/MWSCAS.2003.1562542
