Title :
Design of experiments approach to gradient estimation and its application to CMOS circuit stochastic optimization
Author :
Zhang, J.C. ; Styblinski, M.A.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
A method using orthogonal array (OA)-based design of experiments is applied to screening and stochastic gradient evaluation for a generalized yield/Taguchi `loss´ function and a general CMOS statistical model. In comparison with the Taguchi approach, the method does not require `inner´ and `outer´ table combinations. The method is shown to be much more efficient than an equivalent Monte Carlo approach on a practical CMOS circuit design example
Keywords :
CMOS integrated circuits; optimisation; statistical analysis; stochastic processes; CMOS circuit; gradient estimation; orthogonal array; screening; stochastic gradient evaluation; stochastic optimization; yield/Taguchi loss function; Circuit synthesis; Covariance matrix; Design optimization; Integrated circuit modeling; Integrated circuit technology; Least squares approximation; Monte Carlo methods; Optimization methods; Semiconductor device modeling; Stochastic processes;
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
DOI :
10.1109/ISCAS.1991.176205
