Design of experiments approach to gradient estimation and its application to CMOS circuit stochastic optimization

Author

Zhang, J.C. ; Styblinski, M.A.

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

fYear

1991

fDate

11-14 Jun 1991

Firstpage

3098

Abstract

A method using orthogonal array (OA)-based design of experiments is applied to screening and stochastic gradient evaluation for a generalized yield/Taguchi `loss´ function and a general CMOS statistical model. In comparison with the Taguchi approach, the method does not require `inner´ and `outer´ table combinations. The method is shown to be much more efficient than an equivalent Monte Carlo approach on a practical CMOS circuit design example

Keywords

CMOS integrated circuits; optimisation; statistical analysis; stochastic processes; CMOS circuit; gradient estimation; orthogonal array; screening; stochastic gradient evaluation; stochastic optimization; yield/Taguchi loss function; Circuit synthesis; Covariance matrix; Design optimization; Integrated circuit modeling; Integrated circuit technology; Least squares approximation; Monte Carlo methods; Optimization methods; Semiconductor device modeling; Stochastic processes;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1991., IEEE International Sympoisum on

Print_ISBN

0-7803-0050-5

Type

conf

DOI

10.1109/ISCAS.1991.176205

Filename

176205

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2824703