Title :
A new efficient approach to VLSI yield improvement via yield/specification trade-offs
Author_Institution :
Dept. of Electr. Eng., Imperial Coll. of Sci. Technol. & Med., London
Abstract :
A method is described for making changes to specifications to optimize yield using information derived from a Monte Carlo analysis. Since nominal values and tolerances are fixed, only one Monte Carlo analysis is required for the entire optimization, i.e. the exploration of performance space is extremely inexpensive. In addition to yield/performance tradeoffs the method can be applied to (1) the definition of performance specifications (often a nontrivial task), and (2) to identification of redundant specifications and performance functions for testing
Keywords :
Monte Carlo methods; VLSI; integrated circuit testing; Monte Carlo analysis; VLSI; performance space; performance specifications; redundant specifications; testing; yield improvement; yield/specification trade-offs; Circuit synthesis; Costs; Fabrication; Integrated circuit technology; Integrated circuit yield; Monte Carlo methods; Resistors; Space exploration; Very large scale integration; Voltage;
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
DOI :
10.1109/ISCAS.1991.176206
