Title :
Small Sample Failure Distribution Research Based on Gray Theory
Author :
Zhou, Jungang ; Li, Lingling ; Li, Zhigang ; Han, Junjie
Author_Institution :
Sch. of Electron. Eng. & Autom., Hebei Univ. of Technol., Tianjin, China
Abstract :
Product failure distribution research is a basic research for product advanced design and manufacture, and has an important role in intelligent computing. Traditional analysis of the failure distribution about small samples has some limitations, for example, the weibull distribution test is better as the sample size is more than 10; the Figure test is better as the sample size is more than 20; the normal distribution test is better as the sample size is between 30 to 50; the K-S test can be applied for small samples, but requires the general distribution and the parameters are known. So the failure distribution needs further research as the sample size is less than 10. The Gray theory is applied to research the product failure distribution as sample size is less than 10 in this paper. Gray theory and small sample research are combined to solve failure distribution and that is a new direction for the intelligent computing.
Keywords :
failure analysis; reliability theory; statistical distributions; Gray theory; K-S test; intelligent computing; product advanced design; product failure distribution research; small sample failure distribution research; Design engineering; Distributed computing; Equations; Failure analysis; Gaussian distribution; Life testing; Manufacturing automation; Probability; Shape; Weibull distribution;
Conference_Titel :
Information Engineering and Computer Science, 2009. ICIECS 2009. International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4994-1
DOI :
10.1109/ICIECS.2009.5363792