• DocumentCode
    2824779
  • Title

    Finite element method applied to shielding performance of enclosures

  • Author

    Gravelle, L.B. ; Costache, G.I.

  • Author_Institution
    Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
  • fYear
    1988
  • fDate
    2-4 Aug. 1988
  • Firstpage
    69
  • Lastpage
    72
  • Abstract
    The shielding effectiveness of enclosures is predicted by means of a computer simulation based on the finite-element technique. To characterize shielding performance, possible sources of electromagnetic interference (EMI), such as radiated EMI, conducted EMI, grounding, electrostatic discharge and environmental effects, along with their corresponding distances (near- or far-field) to the equipment under test (EUT), are examined. The analysis considers only the penetration of the magnetic field through the walls and apertures, since the electric field attenuation is high when a good conducting material is used for the shield. A finite-element method that is based on a magnetic vector-potential formulation is used; it can be applied to calculate the shielding effectiveness of any arbitrary selected enclosure. The ultimate purpose of this CAD tool is to establish guidelines regarding aperture spacing on the enclosure and to identify regions of high field intensity that must be avoided by designers when locating sensitive circuits.<>
  • Keywords
    CAD; digital simulation; electromagnetic interference; finite element analysis; magnetic fields; magnetic shielding; CAD tool; computer simulation; conducted EMI; electric field attenuation; electromagnetic interference; electrostatic discharge; environmental effects; equipment under test; far-field; finite-element technique; grounding; magnetic field; magnetic vector-potential formulation; near field; radiated EMI; shielding performance; Apertures; Computer simulation; Electromagnetic interference; Electrostatic discharge; Electrostatic interference; Finite element methods; Grounding; Magnetic analysis; Magnetic shielding; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1988. Symposium Record., IEEE 1988 International Symposium on
  • Conference_Location
    Seattle, WA, USA
  • Type

    conf

  • DOI
    10.1109/ISEMC.1988.14089
  • Filename
    14089