DocumentCode
2824779
Title
Finite element method applied to shielding performance of enclosures
Author
Gravelle, L.B. ; Costache, G.I.
Author_Institution
Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
fYear
1988
fDate
2-4 Aug. 1988
Firstpage
69
Lastpage
72
Abstract
The shielding effectiveness of enclosures is predicted by means of a computer simulation based on the finite-element technique. To characterize shielding performance, possible sources of electromagnetic interference (EMI), such as radiated EMI, conducted EMI, grounding, electrostatic discharge and environmental effects, along with their corresponding distances (near- or far-field) to the equipment under test (EUT), are examined. The analysis considers only the penetration of the magnetic field through the walls and apertures, since the electric field attenuation is high when a good conducting material is used for the shield. A finite-element method that is based on a magnetic vector-potential formulation is used; it can be applied to calculate the shielding effectiveness of any arbitrary selected enclosure. The ultimate purpose of this CAD tool is to establish guidelines regarding aperture spacing on the enclosure and to identify regions of high field intensity that must be avoided by designers when locating sensitive circuits.<>
Keywords
CAD; digital simulation; electromagnetic interference; finite element analysis; magnetic fields; magnetic shielding; CAD tool; computer simulation; conducted EMI; electric field attenuation; electromagnetic interference; electrostatic discharge; environmental effects; equipment under test; far-field; finite-element technique; grounding; magnetic field; magnetic vector-potential formulation; near field; radiated EMI; shielding performance; Apertures; Computer simulation; Electromagnetic interference; Electrostatic discharge; Electrostatic interference; Finite element methods; Grounding; Magnetic analysis; Magnetic shielding; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1988. Symposium Record., IEEE 1988 International Symposium on
Conference_Location
Seattle, WA, USA
Type
conf
DOI
10.1109/ISEMC.1988.14089
Filename
14089
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