Title :
Design for BIT of electronic system based on boundary scan
Author :
Chen, Shengjian ; Wang, Mengmeng ; Wang, Jinyang ; Li, Kun
Author_Institution :
Dept. of Control Eng., Acad. of Armored Force Eng., Beijing, China
Abstract :
Boundary scan test is a standard measurability design technology, and it is more convenient for the measurement of complex circuits. Based on the basic principle of boundary scan and one system´s CPU board, the boundary scan design and configuration of the system´s control circuit are presented and validated. According to the experiments of the designed CPU, the circuit can realize the functions of the boundary scan test and locate faults rapidly. It could efficaciously promote the measurability of the electronic system.
Keywords :
boundary scan testing; built-in self test; fault diagnosis; CPU board; CPU design; boundary scan design; complex circuit; electronic system design; measurability design technology; system control circuit; Central Processing Unit; Circuit faults; Fault detection; Microcontrollers; Random access memory; Registers; Testing; BIT; boundary scan; fault diagnosis;
Conference_Titel :
Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on
Conference_Location :
Hohhot
Print_ISBN :
978-1-4244-9436-1
DOI :
10.1109/MACE.2011.5988727
