DocumentCode
2825111
Title
Design for BIT of electronic system based on boundary scan
Author
Chen, Shengjian ; Wang, Mengmeng ; Wang, Jinyang ; Li, Kun
Author_Institution
Dept. of Control Eng., Acad. of Armored Force Eng., Beijing, China
fYear
2011
fDate
15-17 July 2011
Firstpage
7271
Lastpage
7274
Abstract
Boundary scan test is a standard measurability design technology, and it is more convenient for the measurement of complex circuits. Based on the basic principle of boundary scan and one system´s CPU board, the boundary scan design and configuration of the system´s control circuit are presented and validated. According to the experiments of the designed CPU, the circuit can realize the functions of the boundary scan test and locate faults rapidly. It could efficaciously promote the measurability of the electronic system.
Keywords
boundary scan testing; built-in self test; fault diagnosis; CPU board; CPU design; boundary scan design; complex circuit; electronic system design; measurability design technology; system control circuit; Central Processing Unit; Circuit faults; Fault detection; Microcontrollers; Random access memory; Registers; Testing; BIT; boundary scan; fault diagnosis;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on
Conference_Location
Hohhot
Print_ISBN
978-1-4244-9436-1
Type
conf
DOI
10.1109/MACE.2011.5988727
Filename
5988727
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