Title :
The design of reliable VLSI electronic systems for digital signal processing
Author :
Jenkins, W. Kenneth
Author_Institution :
Coordinated Sci. Lab., Urbana, IL, USA
Abstract :
The author reviews number-theoretic techniques for achieving hardware modularity in order to facilitate high data rates, testability, reliability, and fault tolerance, in VLSI digital signal processing systems. The theory of RNS (residue number system) error detection and correction is reviewed, and the special properties of modular systems are discussed for providing a rich environment for fault tolerant designs. Questions of reliability and fault tolerance on both the integrated circuit level and higher systems levels are discussed. The design of a convolutional back-projection digital processor for synthetic aperture radar (SAR) image processing is used as an example to investigate appropriate interactions between circuit-level error checking and system-level fault tolerance
Keywords :
VLSI; circuit reliability; computerised picture processing; digital signal processing chips; error correction; error detection; fault tolerant computing; number theory; radar equipment; RNS error correction; RNS error detection; SAR image processing; VLSI design; circuit-level error checking; convolutional back-projection digital processor; digital signal processing; fault tolerance; hardware modularity; high data rates; number-theoretic techniques; reliable VLSI electronic systems; residue number system; synthetic aperture radar; testability; Digital signal processing; Electrical fault detection; Error correction; Fault detection; Fault tolerant systems; Hardware; Integrated circuit reliability; Signal design; System testing; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
DOI :
10.1109/ISCAS.1991.176259
