DocumentCode
2825515
Title
Built-in current sensor for IDDQ test
Author
Xue, Bin ; Walker, D.M.H.
Author_Institution
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX
fYear
2004
fDate
25-25 April 2004
Firstpage
3
Lastpage
9
Abstract
A practical built-in current sensor (BICS) design is described in this paper. This sensor system is able to monitor the IDDQ at a resolution level of 10 muA. This system can translate the current level into a digital signal, with scan chain readout. There is no system performance degradation for this sensor and its power dissipation is kept at a very low level. With the help of a self-calibration circuit, the sensor can maintain its accuracy and achieve a clock rate of over 1 GHz, for a measurement time of a few milliseconds
Keywords
built-in self test; electric current measurement; electric sensing devices; integrated circuit testing; BICS design; IDDQ monitoring; IDDQ test; built-in current sensor; current level; digital signal; power dissipation; scan chain readout; self-calibration circuit; Circuits; Clocks; Degradation; Monitoring; Power dissipation; Sensor phenomena and characterization; Sensor systems; Signal resolution; System performance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on
Conference_Location
Napa Valley, CA
Print_ISBN
0-7803-8950-6
Type
conf
DOI
10.1109/DBT.2004.1408945
Filename
1408945
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