DocumentCode :
2825965
Title :
Studies on small- and large-signal noise in solid-state amplifiers
Author :
Portilla, Javier ; Jauregui, Ricardo ; Garmendia, N.
Author_Institution :
Dept. of Electr. & Electron., Univ. of the Basque Country, Leioa, Spain
fYear :
2013
fDate :
7-9 April 2013
Firstpage :
1
Lastpage :
6
Abstract :
The paper reports a summary of results concerning the study of noise in solid-state amplifiers, operating under smalland large-signal conditions. Starting from the standard Noise Figure (NF), we go through the effective NF which provides a measure of the white noise contribution as carrier power drives the amplifier into compression. This effective NF is derived from the white noise portion of AM and PM spectra around the carrier. Amplifier flicker noise contribution is also subject of the work. The effect of input and output matching conditions on the amplifier AM and PM noise, as well as on effective NF, has also been investigated and results are presented demonstrating that, under large-signal conditions, the amplifier AM, PM, and effective NF levels depend on input and output matching impedances. On the other hand, we discuss about the correlation between the degradation of noise performances, as the amplifier is driven into compression, with the evolution of the derivatives of the AM-AM and AM-PM conversion curves. Finally, the amplifier noise in presence of an interfering signal is also addressed.
Keywords :
amplifiers; amplitude modulation; circuit noise; flicker noise; impedance matching; nonlinear distortion; phase modulation; white noise; AM spectra; AM-AM conversion curves; AM-PM conversion curves; PM spectra; amplifier flicker noise contribution; amplifier noise; input matching conditions; large-signal conditions; matching impedances; noise performance degradation; output matching conditions; small-signal conditions; solid-state amplifiers; standard Noise Figure; white noise contribution; Atmospheric measurements; Isolators; Noise measurement; Particle measurements; Power measurement; Radio frequency; AM and PM noise; nonlinear noise; solid-state amplifier;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless and Microwave Technology Conference (WAMICON), 2013 IEEE 14th Annual
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-5536-0
Electronic_ISBN :
978-1-4673-5535-3
Type :
conf
DOI :
10.1109/WAMICON.2013.6572776
Filename :
6572776
Link To Document :
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