مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2826270

Title :

Author index

fYear :

2004

fDate :

25-25 April 2004

Firstpage :

113

Lastpage :

113

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on

Conference_Location :

Napa Valley, CA

Print_ISBN :

0-7803-8950-6

Type :

conf

DOI :

10.1109/DBT.2004.1408972

Filename :

1408972

Link To Document :