DocumentCode :
2826664
Title :
Physics-Technological Fabrication Features and Parameters of InP MM-Wave Gunn Diodes
Author :
Arsentiev, I.N. ; Belyaev, A.E. ; Bobyl, A.V. ; Boltovets, N.S. ; Ivanov, V.N. ; Kovtonyuk, V.M. ; Konakova, R.V. ; Kudryk, Ya.Ya. ; Milenin, V.V. ; Tarasov, I.S. ; Markovskyi, E.P. ; Redko, R.A. ; Russu, E.V.
Author_Institution :
Ioffe PhysicoTech. Inst. RAN, Sankt-Peterburg
Volume :
2
fYear :
2006
fDate :
Sept. 2006
Firstpage :
642
Lastpage :
643
Abstract :
We developed (i) a technology to form Au-Ge-TiBx-Au ohmic contacts to indium phosphide Gunn diodes on the basis of n-n+ -n++ epitaxial structures made on the standard and porous n++-InP substrates, (ii) batch-fabrication technique for mesas with gold heat sink, and (iii) technique for diode chip packaging in a metal-quartz package. It is shown that the Gunn diodes of both types (on the standard and porous substrates) ensure generation of microwave power in the 88-98 GHz frequency range. When operating under normal climatic conditions and at a temperature no less than -40degC, the power output Pout of the Gunn diodes made on the porous substrates is over that of the ones made on the standard substrates. At package temperature of +75degC, the power output of the Gunn diodes of both types decreases, with Pout value of the diodes made on the porous substrate becoming somewhat below that of the ones made on the standard substrate. We suppose that the reason for Pout decrease is the temperature dependence of thermal conductivity which is different in the standard and porous InP
Keywords :
Gunn diodes; III-V semiconductors; elemental semiconductors; germanium; gold; indium compounds; millimetre wave diodes; ohmic contacts; porous semiconductors; semiconductor epitaxial layers; thermal conductivity; titanium compounds; 75 C; 88 to 98 GHz; Au-Ge-TiBx-Au; InP; diode chip packaging; gold heat sink; indium phosphide Gunn diodes; metal-quartz package; mm-wave Gunn diodes; n-n+-n++ epitaxial structures; ohmic contacts; physics-technological fabrication; porous n++-indium phosphide substrates; standard substrates; thermal conductivity; Diodes; Fabrication; Gunn devices; Indium phosphide; Ohmic contacts; Packaging; Standards development; Substrates; Temperature; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-92-8
Electronic_ISBN :
966-7968-92-8
Type :
conf
DOI :
10.1109/CRMICO.2006.256140
Filename :
4023422
Link To Document :
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