Title :
Higher-order Wavelet Statistics and their Application to Digital Forensics
Author :
Farid, Hany ; Lyu, Siwei
Author_Institution :
Dartmouth College, Hanover
Abstract :
We describe a statistical model for natural images that is built upon a multi-scale wavelet decomposition. The model consists of first- and higher-order statistics that capture certain statistical regularities of natural images. We show how this model can be useful in several digital forensic applications, specifically in detecting various types of digital tampering.
Keywords :
Digital forensics; Filters; Frequency; Gray-scale; Higher order statistics; Image coding; Image decomposition; Markov random fields; Pixel; Statistical distributions;
Conference_Titel :
Computer Vision and Pattern Recognition Workshop, 2003. CVPRW '03. Conference on
Conference_Location :
Madison, Wisconsin, USA
Print_ISBN :
0-7695-1900-8
DOI :
10.1109/CVPRW.2003.10093
