DocumentCode :
2827056
Title :
Techniques to improve sharpness and stop band rejection of Defected Ground Structure based low pass filter
Author :
Kumar, Ashwani ; Verma, A.K.
Author_Institution :
Dept. of Electron. Sci., Univ. of Delhi, New Delhi, India
fYear :
2011
fDate :
18-22 Dec. 2011
Firstpage :
1
Lastpage :
5
Abstract :
We propose a new technique to improve the sharpness and stopband rejection. This paper presents a more sharper and wide rejection band low pass filter using Defected Ground Structure (DGS). In this work DGS is realize as a quasi-lumped inductance and the sharpness of cut-off has been controlled by varying the slot neck length and stop band rejection by varying the slot neck width. Such findings are useful for the design of a compact LPF with sharper cutoff and wide stop band rejection.
Keywords :
band-stop filters; defected ground structures; inductance; low-pass filters; DGS; compact LPF design; defected ground structure based low pass filter; quasilumped inductance; rejection band low pass filter; sharpness; slot neck length; slot neck width; stopband rejection; Capacitance; Inductance; Low pass filters; Microstrip; Microstrip filters; Microwave filters; Neck; Defected Ground Structure (DGS); Low Pass Filter; Microstrip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Electromagnetics Conference (AEMC), 2011 IEEE
Conference_Location :
Kolkata
Print_ISBN :
978-1-4577-1098-8
Type :
conf
DOI :
10.1109/AEMC.2011.6256895
Filename :
6256895
Link To Document :
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