• DocumentCode
    2827165
  • Title

    Influence of Pulsed Electromagnetic Fields Upon Integral Memory Microcircuit

  • Author

    Ahramovich, L. ; Gribski, M. ; Grigoriev, E. ; Zuev, S. ; Starostenko, V. ; Churyumov, G. ; Borisov, A. ; Petrov, A.

  • Author_Institution
    Vernadsky Tavrical Nat. Univ., Simferopol
  • Volume
    2
  • fYear
    2006
  • fDate
    Sept. 2006
  • Firstpage
    721
  • Lastpage
    722
  • Abstract
    The experimental study method of the direct influence by pulsed electromagnetic fields on modern microcircuits of the memories is described. The field values, under which the malfunction in the microcircuits working and degradation phenomena in microstructures element of the crystal and discharge of the microcircuits begin, are obtained
  • Keywords
    electromagnetic interference; electromagnetic pulse; integrated circuits; integral memory microcircuit; microstructure element; pulsed electromagnetic fields; EMP radiation effects; Electromagnetic fields; IEEE catalog; Microwave technology; Organizing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
  • Conference_Location
    Sevastopol, Crimea
  • Print_ISBN
    966-7968-92-8
  • Electronic_ISBN
    966-7968-92-8
  • Type

    conf

  • DOI
    10.1109/CRMICO.2006.256173
  • Filename
    4023455
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2827165