• DocumentCode
    2827414
  • Title

    Investigation of the Low-Loss Dielectric Materials in the Wide Temperature Range

  • Author

    Derkach, V. ; Golovashchenko, R. ; Goroshko, O. ; Nedukh, S. ; Tarapov, S.

  • Author_Institution
    Usikov Inst. of Radiophys. & Electron., Nat. Acad. of Sci., Kharkov
  • Volume
    2
  • fYear
    2006
  • fDate
    Sept. 2006
  • Firstpage
    758
  • Lastpage
    759
  • Abstract
    The operational regimes of cryodielectrometer designed for measurement the dielectric parameters of materials with small dissipation in millimeter waveband is described. Dependences of loss tangent on temperature for some dielectric and semiconductor materials in frequency band 40-80 GHz and temperature range 0.85-300 K are analyzed
  • Keywords
    cryogenics; dielectric loss measurement; dielectric materials; millimetre wave measurement; semiconductor materials; 0.85 to 300 K; 40 to 80 GHz; cryodielectrometer design; dissipation; low-loss dielectric material; millimeter waveband; parameters measurement; semiconductor material; Dielectric materials; Quadratic programming; Refrigeration; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
  • Conference_Location
    Sevastopol, Crimea
  • Print_ISBN
    966-7968-92-8
  • Electronic_ISBN
    966-7968-92-8
  • Type

    conf

  • DOI
    10.1109/CRMICO.2006.256189
  • Filename
    4023471
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2827414