Title :
Inverse Problem of Scattering in Scanning Near-Field Tomography
Author_Institution :
Inst. for Phys. of Microstruct., Russian Acad. of Sci., Nizhny Novgorod
Abstract :
A new tomography method of the inhomogeneous half-space is proposed that can be realized in the scanning probe microscopy and other kinds of electromagnetic diagnostics of media. In this method the 2D scanning of variations of the signal related to inhomogeneities in a medium are in use. The scanning should be done at various values of a parameter that determines the effective depth of the formation of the received signal
Keywords :
electromagnetic wave scattering; inhomogeneous media; inverse problems; nondestructive testing; scanning probe microscopy; tomography; 2D scanning; electromagnetic diagnostics media; inhomogeneous half-space; inverse problem; scanning probe microscopy; scattering; tomography method; IEEE catalog; Inverse problems; Microwave technology; Organizing; Scattering; Tomography;
Conference_Titel :
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-92-8
Electronic_ISBN :
966-7968-92-8
DOI :
10.1109/CRMICO.2006.256192
