DocumentCode
2827464
Title
Inverse Problem of Scattering in Scanning Near-Field Tomography
Author
Gaikovich, K.
Author_Institution
Inst. for Phys. of Microstruct., Russian Acad. of Sci., Nizhny Novgorod
Volume
2
fYear
2006
fDate
Sept. 2006
Firstpage
765
Lastpage
766
Abstract
A new tomography method of the inhomogeneous half-space is proposed that can be realized in the scanning probe microscopy and other kinds of electromagnetic diagnostics of media. In this method the 2D scanning of variations of the signal related to inhomogeneities in a medium are in use. The scanning should be done at various values of a parameter that determines the effective depth of the formation of the received signal
Keywords
electromagnetic wave scattering; inhomogeneous media; inverse problems; nondestructive testing; scanning probe microscopy; tomography; 2D scanning; electromagnetic diagnostics media; inhomogeneous half-space; inverse problem; scanning probe microscopy; scattering; tomography method; IEEE catalog; Inverse problems; Microwave technology; Organizing; Scattering; Tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
966-7968-92-8
Electronic_ISBN
966-7968-92-8
Type
conf
DOI
10.1109/CRMICO.2006.256192
Filename
4023474
Link To Document