DocumentCode
2827561
Title
Measurements of Slow Relaxation Times of Ferroelectric Films by Means of Resonance Method
Author
Kozyrev, A. ; Gaidukov, M. ; Gagarin, A. ; Altynnikov, A.
Author_Institution
St-Petersburg Electrotech. Univ., St. Petersburg
Volume
2
fYear
2006
fDate
Sept. 2006
Firstpage
778
Lastpage
779
Abstract
Measurements of slow relaxation times of ferroelectric (FE) films by resonance method under periodical voltage pulses is considered. FE film-based varactors allows measuring at different pulse and pause time and provides sufficient accuracy
Keywords
dielectric relaxation; dielectric resonance; ferroelectric thin films; ferroelectric films; periodical voltage pulses; resonance method; slow relaxation times measurement; Capacitance; Ferroelectric films; Helium; IEEE catalog; Iron; Microwave devices; Microwave technology; Organizing; Resonance; Varactors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
966-7968-92-8
Electronic_ISBN
966-7968-92-8
Type
conf
DOI
10.1109/CRMICO.2006.256197
Filename
4023479
Link To Document