DocumentCode

2827600

Title

The Near-Field Far-Field Transition in Interferometric Microscopy: Implications for Superresolution Approaches

Author

Totzeck, M. ; Tiziani, H.J.

Author_Institution

Institut Fur Technishe Optik, Universitat Stutgart, Pfaffenwaldring 9, D-70569 Stutgart, Germany

fYear

1996

fDate

8-13 Sept. 1996

Firstpage

29

Lastpage

29

Keywords

Charge carrier processes; Force measurement; Gray-scale; Nonlinear optics; Optical filters; Optical interferometry; Optical microscopy; Paints; Silicon; Springs;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-optics Europe, 1996. CLEO/Europe., Conference on

Conference_Location

Hamburg, Germany

Print_ISBN

0-7803-3169-9

Type

conf

DOI

10.1109/CLEOE.1996.562005

Filename

562005