• DocumentCode
    2827698
  • Title

    A new totally error propagating compactor for arbitrary cores with digital interfaces

  • Author

    Gössel, M. ; Sogomonyan, E.S. ; Morosov, A.

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Potsdam, Germany
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    49
  • Lastpage
    56
  • Abstract
    In this paper a new totally error propagating compactor is proposed which can be used for arbitrary core-based designs and also for mixed signal ICs with digital interfaces. All errors at the outputs of the cores are detected at the outputs of the proposed compactor. This property is achieved with a small amount of time redundancy
  • Keywords
    VLSI; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; redundancy; BIST; VLSI; arbitrary cores; core-based designs; digital interfaces; mixed signal ICs; time redundancy; totally error propagating compactor; Built-in self-test; Circuit faults; Circuit testing; Compaction; Computer errors; Computer science; Fault tolerance; Hardware; Pins; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1999. Proceedings. 17th IEEE
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-0146-X
  • Type

    conf

  • DOI
    10.1109/VTEST.1999.766646
  • Filename
    766646
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2827698