DocumentCode :
2827751
Title :
Simulation-based design error diagnosis and correction in combinational digital circuits
Author :
Nayak, Debashis ; Walker, D.M.H.
Author_Institution :
Cadence Design Syst., Chelmsford, MA, USA
fYear :
1999
fDate :
1999
Firstpage :
70
Lastpage :
78
Abstract :
This paper describes an approach to design error diagnosis and correction in combinational digital circuits. Our approach targets small errors introduced during the design process or due to specification changes. We incrementally use simulation to identify suspect nets, and then attempt correction based on our error model. We use multiple iterations to handle multiple errors. Experimental results on ISCAS´85 benchmarks are shown for circuits containing up to four random errors. Diagnosis and correction can be done quickly, with the bulk of the time going to diagnosis. Our tool is accurate in that even with multiple errors present, the corrected circuit is identical to the original most of the time
Keywords :
circuit simulation; combinational circuits; error correction; fault diagnosis; integrated circuit design; integrated circuit testing; iterative methods; logic testing; ISCAS´85 benchmarks; combinational digital circuits; design error correction; design error diagnosis; design process; error model; multiple errors; multiple iterations; random errors; simulation-based design error; specification changes; Binary decision diagrams; Circuit simulation; Circuit synthesis; Computational modeling; Computer errors; Computer science; Counting circuits; Digital circuits; Error correction; Process design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location :
Dana Point, CA
ISSN :
1093-0167
Print_ISBN :
0-7695-0146-X
Type :
conf
DOI :
10.1109/VTEST.1999.766649
Filename :
766649
Link To Document :
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