DocumentCode
2828027
Title
Techniques to encode and compress fault dictionaries
Author
Chakravarty, Sreejit ; Gopal, Vinodh
Author_Institution
Intel Corp., Santa Clara, CA, USA
fYear
1999
fDate
1999
Firstpage
195
Lastpage
200
Abstract
Dictionary encoding schemes have not addressed the cost of reconstructing the dictionary during fault location. We show that by modifying a previously proposed dictionary encoding scheme only small portions of the information need be reconstructed during fault location. This provides a mechanism to reduce the number of secondary accesses during fault location. For pass-fail dictionaries, we present a simplified encoding scheme that reduces both the secondary storage requirement as well as the number of secondary accesses. A novel dictionary structure, known as hybrid dictionaries, which retains the full resolution with respect to modeled faults is presented. Heuristics to compute such dictionaries, its usefulness and how such dictionaries can be encoded for quick information retrieval are discussed
Keywords
combinational circuits; data compression; data structures; digital integrated circuits; encoding; fault location; integrated circuit testing; integrated logic circuits; logic testing; sequential circuits; dictionary encoding schemes; fault diagnosis; fault dictionaries; fault dictionary compression; fault location; heuristics; hybrid dictionaries; pass-fail dictionaries; secondary accesses reduction; secondary storage requirement reduction; Circuit faults; Circuit testing; Costs; Data mining; Data structures; Dictionaries; Encoding; Fault diagnosis; Fault location; Information retrieval;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location
Dana Point, CA
ISSN
1093-0167
Print_ISBN
0-7695-0146-X
Type
conf
DOI
10.1109/VTEST.1999.766665
Filename
766665
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