DocumentCode :
2828028
Title :
Effects of mode conversion on parasitic coupling in high-speed VLSI circuits
Author :
Quéré, Y. ; Le Gouguec, Thierry ; Martin, P.M. ; Le Berre, Daniel ; Huret, F.
Author_Institution :
Lab. d´´Electronique et Syst. de Telecommun., UMR CNRS, Brest, France
fYear :
2004
fDate :
9-12 May 2004
Firstpage :
193
Lastpage :
196
Abstract :
The mode conversion means that a modification of the electromagnetic field configuration occurs, generally, after discontinuities. In deep submicron digital ULSI circuits, the mode conversion analysis is indispensable to identify the signal return path, the return current distribution and therefore, for an accurate inductance modelling which remains a challenging problem (Y. I. Ismael and E. G. Friedman, 2000). On the other hand, switching activity of high speed CMOS circuit may produce large current derivatives in wires (crosstalk) and substrate. These current transients can generate large potential surges and coupled noise. In this mind, a reduction of the mode conversion phenomenon decreases noise in high speed ULSI circuits (Y. Quere et al., 2003). We have investigated the mode conversion, in the frequency domain, for multiple-line inter-layer transitions in CMOS devices. The signal integrity analysis in time domain proved the detrimental effects of mode conversion. Finally, we confirmed that our design rule reduces the mode conversion phenomenon in the case of transition with multiple coupled lines.
Keywords :
CMOS digital integrated circuits; ULSI; VLSI; crosstalk; electromagnetic coupling; frequency-domain analysis; high-speed integrated circuits; integrated circuit interconnections; integrated circuit modelling; time-domain analysis; CMOS devices; coupled noise; current transients; deep submicron digital ULSI circuits; electromagnetic field configuration; frequency domain; high speed CMOS circuit; high speed ULSI circuits; high-speed VLSI circuits; inductance modelling; interconnect discontinuities; mode conversion; multiple coupled lines; multiple-line inter-layer transitions; parasitic coupling; potential surges; return current distribution; signal integrity analysis; signal return path; switching activity; time domain; Circuit noise; Coupling circuits; Crosstalk; Current distribution; Electromagnetic fields; Inductance; Signal analysis; Signal processing; Ultra large scale integration; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects, 2004. Proceedings. 8th IEEE Workshop on
Print_ISBN :
0-7803-8470-9
Type :
conf
DOI :
10.1109/SPI.2004.1409050
Filename :
1409050
Link To Document :
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