Soft Error Tolerant Carry-Select Adders Implemented into Altera FPGAs

The drastic shrink in transistor dimensions is making circuits more susceptible to radiation-induced soft errors. While single-event upsets are beginning to be a concern for electronic systems fabricated with nanometer CMOS technology at the sea level, single-event transients (SETs) are also expected to be a serious problem for the upcoming technologies. Thanks to the high logic density and fast turnaround time, FPGAs are currently the main fabric used to implement electronic systems. However, to provide high logic density FPGA devices are also fabricated with state-of-the-art CMOS technology and thus are also susceptible to soft errors. This paper presents a novel technique to protect carry-select adders against SETs. Such technique is based on triple module redundancy (TMR) and explores the inherent duplication existing in carry-select adders to reduce resource overhead.