• DocumentCode
    2828151
  • Title

    The study of film´s local vacancy defect effects on the thermal conductivities of argon thin films

  • Author

    Liu, Qi-Xin

  • Author_Institution
    Sch. of Civil Eng. & Archit., Chongqing Univ. of Sci. & Technol., Chongqing, China
  • fYear
    2011
  • fDate
    15-17 July 2011
  • Firstpage
    7855
  • Lastpage
    7857
  • Abstract
    It is well known that the vacancy defect in solid will reduce the thermal conduction and the thermal conductivity of thin film is lower than bulk counterpart. In this paper one novel film structure was constructed to study the local vacancy defect effects on the thermal conductivities of argon thin films by molecular simulation. Both the theoretical and MD simulation results illustrate that although both the defect and thickness of thin film deduce the thermal conductivity, their physical mechanisms are different.
  • Keywords
    argon; thermal conductivity; thin films; vacancies (crystal); Ar; argon thin films; film local vacancy defect effect; film structure; molecular simulation; thermal conduction; thermal conductivity; Argon; Conductivity; Films; Scattering; Solids; Thermal analysis; Thermal conductivity; thermal conduction; vacancy defect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on
  • Conference_Location
    Hohhot
  • Print_ISBN
    978-1-4244-9436-1
  • Type

    conf

  • DOI
    10.1109/MACE.2011.5988875
  • Filename
    5988875