DocumentCode
2828151
Title
The study of film´s local vacancy defect effects on the thermal conductivities of argon thin films
Author
Liu, Qi-Xin
Author_Institution
Sch. of Civil Eng. & Archit., Chongqing Univ. of Sci. & Technol., Chongqing, China
fYear
2011
fDate
15-17 July 2011
Firstpage
7855
Lastpage
7857
Abstract
It is well known that the vacancy defect in solid will reduce the thermal conduction and the thermal conductivity of thin film is lower than bulk counterpart. In this paper one novel film structure was constructed to study the local vacancy defect effects on the thermal conductivities of argon thin films by molecular simulation. Both the theoretical and MD simulation results illustrate that although both the defect and thickness of thin film deduce the thermal conductivity, their physical mechanisms are different.
Keywords
argon; thermal conductivity; thin films; vacancies (crystal); Ar; argon thin films; film local vacancy defect effect; film structure; molecular simulation; thermal conduction; thermal conductivity; Argon; Conductivity; Films; Scattering; Solids; Thermal analysis; Thermal conductivity; thermal conduction; vacancy defect;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on
Conference_Location
Hohhot
Print_ISBN
978-1-4244-9436-1
Type
conf
DOI
10.1109/MACE.2011.5988875
Filename
5988875
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