DocumentCode :
2828151
Title :
The study of film´s local vacancy defect effects on the thermal conductivities of argon thin films
Author :
Liu, Qi-Xin
Author_Institution :
Sch. of Civil Eng. & Archit., Chongqing Univ. of Sci. & Technol., Chongqing, China
fYear :
2011
fDate :
15-17 July 2011
Firstpage :
7855
Lastpage :
7857
Abstract :
It is well known that the vacancy defect in solid will reduce the thermal conduction and the thermal conductivity of thin film is lower than bulk counterpart. In this paper one novel film structure was constructed to study the local vacancy defect effects on the thermal conductivities of argon thin films by molecular simulation. Both the theoretical and MD simulation results illustrate that although both the defect and thickness of thin film deduce the thermal conductivity, their physical mechanisms are different.
Keywords :
argon; thermal conductivity; thin films; vacancies (crystal); Ar; argon thin films; film local vacancy defect effect; film structure; molecular simulation; thermal conduction; thermal conductivity; Argon; Conductivity; Films; Scattering; Solids; Thermal analysis; Thermal conductivity; thermal conduction; vacancy defect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on
Conference_Location :
Hohhot
Print_ISBN :
978-1-4244-9436-1
Type :
conf
DOI :
10.1109/MACE.2011.5988875
Filename :
5988875
Link To Document :
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