Title :
A test point insertion algorithm for mixed-signal circuits
Author :
Zhang, Jinyan ; Huynh, Sam ; Soma, Mani
Author_Institution :
Dept. of Electr. Eng., Washington Univ., USA
Abstract :
This paper presents an algorithm based on testability measurement for test point insertion of mixed-signal circuits. Two transfer function models compatible with analog models are proposed: one is for digital devices and the other is for A/D interface components. An industry power supply circuit and a common A/D converter circuit are used to validate our approaches
Keywords :
design for testability; integrated circuit modelling; integrated circuit testing; mixed analogue-digital integrated circuits; transfer functions; A/D interface components; digital devices; industry power supply circuit; mixed-signal circuits; test point insertion algorithm; testability measurement; transfer function models; Circuit testing; Controllability; Costs; Current measurement; Design for testability; Digital circuits; Impedance; Observability; System testing; Voltage;
Conference_Titel :
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location :
Dana Point, CA
Print_ISBN :
0-7695-0146-X
DOI :
10.1109/VTEST.1999.766682
