• DocumentCode
    2828327
  • Title

    Effect of interfacial phonon-plasmon modes on electrical transport in supported graphene

  • Author

    Ong, Zhun-Yong ; Fischetti, Massimo Y.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Univ. of Texas at Dallas, Richardson, TX, USA
  • fYear
    2012
  • fDate
    18-20 June 2012
  • Firstpage
    29
  • Lastpage
    30
  • Abstract
    This paper discusses the effects of interfacial phonon-plasmon modes on electrical transport in supported graphene. The mobility in graphene supported on an insulating dielectric substrate (such as SiO2) is typically due to scattering by charged impurities, surface roughness and surface polar phonon (SPP) modes. Although impurity scattering is the dominant factor limiting electron mobility it can be reduced experimentally. Coupling between the SPP and graphene plasmon modes leads to the formation of interfacial phonon-plasmon (lPP) modes which can also be interpreted as screened SPP modes. IPP dispersion and electron-IPP scattering rates were used for different substrates (SiO2, h-BN, HfO2 and Al2O3) to calculate the substrate-limited conductivity and field mobility of supported graphene.
  • Keywords
    III-V semiconductors; aluminium compounds; boron compounds; electrical conductivity; electron mobility; graphene; hafnium compounds; impurity scattering; interface phonons; phonon dispersion relations; phonon-plasmon interactions; silicon compounds; surface phonons; surface plasmons; wide band gap semiconductors; C-Al2O3; C-BN; C-HfO2; C-SiO2; charge impurities; electrical conductivity; electrical transport; graphene electron field mobility; impurity scattering; insulating dielectric substrates; interfacial phonon-mode dispersion; interfacial phonon-plasmon mode effects; screened surface plasmon modes; supported graphene; surface polar phonon modes; surface roughness; Hafnium compounds; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2012 70th Annual
  • Conference_Location
    University Park, TX
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4673-1163-2
  • Type

    conf

  • DOI
    10.1109/DRC.2012.6256961
  • Filename
    6256961