DocumentCode
2828579
Title
PADded cache: a new fault-tolerance technique for cache memories
Author
Shirvani, Philip P. ; McCluskey, Edward J.
Author_Institution
Center for Reliable Comput., Stanford Univ., CA, USA
fYear
1999
fDate
1999
Firstpage
440
Lastpage
445
Abstract
This paper presents a new fault-tolerance technique for cache memories. Current fault-tolerance techniques for caches are limited either by the number of faults that can be tolerated or by the rapid degradation of performance as the number of faults increases. In this paper, we present a new technique that overcomes these two problems. This technique uses a special Programmable Address Decoder (PAD) to disable faulty blocks and to re-map their references to healthy blocks. Simulation results show that the performance degradation of direct-mapped caches with PAD is smaller than the previous techniques. However, for set-associative caches, the overhead of PAD is primarily advantageous if a relatively large number of faults is to be tolerated. The area overhead was estimated at about 10% of the overall cache area for a hypothetical design and is expected to be less for actual designs. The access time overhead is negligible
Keywords
VLSI; cache storage; content-addressable storage; decoding; fault tolerant computing; integrated circuit reliability; integrated memory circuits; PAD technique; cache memories; direct-mapped caches; fault-tolerance technique; performance degradation; programmable address decoder; set-associative caches; Atherosclerosis; Availability; Cache memory; Circuit faults; Decoding; Degradation; Fault detection; Fault tolerance; Humans; Microprocessors;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location
Dana Point, CA
ISSN
1093-0167
Print_ISBN
0-7695-0146-X
Type
conf
DOI
10.1109/VTEST.1999.766701
Filename
766701
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