Title :
Low-cost on-line test for digital filters
Author :
Bayraktaroglu, Ismet ; Orailoglu, Alex
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
A low-cost on-line test scheme for digital filters is proposed. The scheme uses an invariant of the digital filter, the frequency response at specific points, in order to detect possible malfunctioning of the circuit. The analysis performed indicates that 100% fault secureness is possible, if certain design constraints are followed
Keywords :
automatic testing; digital filters; digital integrated circuits; electronic engineering computing; frequency response; integrated circuit testing; circuit malfunctioning detection; design constraints; digital filters; filter invariant; frequency response; low-cost online test scheme; Circuit faults; Circuit testing; Computer science; Delay; Digital filters; Digital signal processing; Fault detection; Life testing; Military communication; Monitoring;
Conference_Titel :
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location :
Dana Point, CA
Print_ISBN :
0-7695-0146-X
DOI :
10.1109/VTEST.1999.766702
