DocumentCode
2828610
Title
Low-cost on-line test for digital filters
Author
Bayraktaroglu, Ismet ; Orailoglu, Alex
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear
1999
fDate
1999
Firstpage
446
Lastpage
451
Abstract
A low-cost on-line test scheme for digital filters is proposed. The scheme uses an invariant of the digital filter, the frequency response at specific points, in order to detect possible malfunctioning of the circuit. The analysis performed indicates that 100% fault secureness is possible, if certain design constraints are followed
Keywords
automatic testing; digital filters; digital integrated circuits; electronic engineering computing; frequency response; integrated circuit testing; circuit malfunctioning detection; design constraints; digital filters; filter invariant; frequency response; low-cost online test scheme; Circuit faults; Circuit testing; Computer science; Delay; Digital filters; Digital signal processing; Fault detection; Life testing; Military communication; Monitoring;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location
Dana Point, CA
ISSN
1093-0167
Print_ISBN
0-7695-0146-X
Type
conf
DOI
10.1109/VTEST.1999.766702
Filename
766702
Link To Document