• DocumentCode
    2828646
  • Title

    Instruction-driven wake-up mechanisms for Snoopy TAP controller

  • Author

    Bhattacharya, Debashis

  • Author_Institution
    Converter Product Dev. Center, Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    467
  • Lastpage
    472
  • Abstract
    The issue of handling multiple embedded 1149.1-compliant TAP controllers (as part of embedded cores) in a 1149.1-compliant IC, has received significant attention, in recent times. The Hierarchical TAP (HTAP) architecture, previously developed by this author, provides a systematic solution to this problem, by allowing multiple embedded TAPs to share one set of 1149.1-specified test pins on the IC. The HTAP architecture requires an augmented version of the 1149.1-specified TAP-designated the Snoopy TAP (SNTAP)-in the top-level of the design hierarchy, that handles 1149.1-specified TAP functions for the non-TAP´ed parts of the IC, and performs arbitration of the shared IC pins between multiple embedded TAPs. Previously, a mechanism was developed to wake up the SNTAP using a simple string of constant values (0 or 1) on the TMS input. Two new mechanisms to wake up SNTAP by means of an instruction scanned in, are described in this report. Both mechanisms allow embedded 1149.1-compliant TAP´s to be used in a hierarchical design, as is, without any hardware modification. Moreover, both mechanisms enable reuse of the test program from the embedded TAP´ed cores, without any modification. The instructions to wake up the SNTAP-to switch access to different TAP-ed cores-can be simply inserted in-between the test programs for the embedded cores
  • Keywords
    application specific integrated circuits; design for testability; embedded systems; instruction sets; integrated circuit testing; microcontrollers; 1149.1-specified test pins; SNTAP; Snoopy TAP controller; arbitration; design hierarchy; hierarchical design; instruction-driven wake-up mechanisms; multiple embedded 1149.1-compliant TAP controllers; test program; Instruments; Integrated circuit testing; Joining processes; Performance evaluation; Pins; Product development; Switches; System testing; Tin; Traffic control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1999. Proceedings. 17th IEEE
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-0146-X
  • Type

    conf

  • DOI
    10.1109/VTEST.1999.766705
  • Filename
    766705