2828687

Preliminary Outline of the IEEE PI 500 Scalable Architecture for Testing Embedded Cores

Adham, Saman ; Burek, D. ; Clark, C.J. ; Collins, Michael ; Giles, G. ; Sales, A. ; Marinissen, Erik Jan ; McLaurin, T. ; Monzel, J. ; Muradali, F. ; Rajoki, J. ; Rajsuman, R. ; Ricchatti, M. ; Stannard, D. ; Udell, J. ; Varma, P. ; Whetsel, L. ; Zamfires

Texas Instruments

1999

25-29 April 1999

483

488

Circuit testing; Design automation; Design engineering; Graphics; Instruments; Logic design; Logic testing; Productivity; System testing; Time to market;

English

ieee

VLSI Test Symposium, 1999. Proceedings. 17th IEEE

Dana Point, CA, USA

1093-0167

0-7695-0146-X

conf

10.1109/VTEST.1999.766707

766707