• DocumentCode
    2828840
  • Title

    Resonant-body silicon nanowire field effect transistor without junctions

  • Author

    Bartsch, Sebastian T. ; Dupré, Cécilia ; Ollier, Eric ; Ionescu, Adrian M.

  • Author_Institution
    Nanoelectron. Devices Lab., Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
  • fYear
    2012
  • fDate
    18-20 June 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, we have demonstrated, for the first time, a self-aligned junctionless silicon nanowire electromechanical FET with two lateral 60 nm air-gap gates. The depletion charge modulation can be harnessed to transduce mechanical resonance on-chip at very high frequencies and is suited for a class of very scaled (sub-50 nm) silicon NEMS. Interfaced with advanced CMOS, these devices can be used in complex collective electromechanical signal processing based on hundreds of thousands of resonant transistors, embedded on a single silicon chip. This should foster a wide range of applications in RF, analog and extreme mass sensing.
  • Keywords
    CMOS integrated circuits; elemental semiconductors; field effect transistors; nanoelectromechanical devices; nanowires; silicon; RF mass sensing; Si; advanced CMOS; analog mass sensing; complex collective electromechanical signal processing; depletion charge modulation; extreme mass sensing; lateral air-gap gates; mechanical resonance on-chip; resonant-body nanowire field effect transistor; self-aligned junctionless nanowire electromechanical FET; size 50 nm; size 60 nm; very scaled NEMS; FETs; Frequency modulation; Logic gates; Nanoelectromechanical systems; Resonant frequency; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2012 70th Annual
  • Conference_Location
    University Park, TX
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4673-1163-2
  • Type

    conf

  • DOI
    10.1109/DRC.2012.6256987
  • Filename
    6256987