DocumentCode :
2828840
Title :
Resonant-body silicon nanowire field effect transistor without junctions
Author :
Bartsch, Sebastian T. ; Dupré, Cécilia ; Ollier, Eric ; Ionescu, Adrian M.
Author_Institution :
Nanoelectron. Devices Lab., Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
fYear :
2012
fDate :
18-20 June 2012
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, we have demonstrated, for the first time, a self-aligned junctionless silicon nanowire electromechanical FET with two lateral 60 nm air-gap gates. The depletion charge modulation can be harnessed to transduce mechanical resonance on-chip at very high frequencies and is suited for a class of very scaled (sub-50 nm) silicon NEMS. Interfaced with advanced CMOS, these devices can be used in complex collective electromechanical signal processing based on hundreds of thousands of resonant transistors, embedded on a single silicon chip. This should foster a wide range of applications in RF, analog and extreme mass sensing.
Keywords :
CMOS integrated circuits; elemental semiconductors; field effect transistors; nanoelectromechanical devices; nanowires; silicon; RF mass sensing; Si; advanced CMOS; analog mass sensing; complex collective electromechanical signal processing; depletion charge modulation; extreme mass sensing; lateral air-gap gates; mechanical resonance on-chip; resonant-body nanowire field effect transistor; self-aligned junctionless nanowire electromechanical FET; size 50 nm; size 60 nm; very scaled NEMS; FETs; Frequency modulation; Logic gates; Nanoelectromechanical systems; Resonant frequency; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2012 70th Annual
Conference_Location :
University Park, TX
ISSN :
1548-3770
Print_ISBN :
978-1-4673-1163-2
Type :
conf
DOI :
10.1109/DRC.2012.6256987
Filename :
6256987
Link To Document :
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