• DocumentCode
    282990
  • Title

    The new `IEE guidelines for assuring testability´

  • Author

    Bond, L.J.

  • Author_Institution
    Univ. Coll. London, UK
  • fYear
    1988
  • fDate
    32170
  • Firstpage
    42522
  • Lastpage
    42525
  • Abstract
    The author introduces the material given in the guidelines to the NDE community. The guidelines are divided into three parts; general principles; technical considerations; and design rules. The first part, general principles, is for general application and includes much useful material for management on testability. The second part, on technical considerations, is product orientated and considers three areas; software, electronic devices and assemblies and electrical and electromechanical products and complex systems. In the third section, the testability is considered as an important issue in design, manufacture and in service; failure to consider it can have significant and potentially serious economic consequences; not least through product liability legislation
  • Keywords
    electronic equipment testing; legislation; nondestructive testing; production testing; program testing; quality control; software engineering; IEE; NDT; assemblies; electrical products; electromechanical products; electronic devices; product liability legislation; production testing; quality assurance; software;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Non-Destructive Evaluation, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    208775