DocumentCode
282990
Title
The new `IEE guidelines for assuring testability´
Author
Bond, L.J.
Author_Institution
Univ. Coll. London, UK
fYear
1988
fDate
32170
Firstpage
42522
Lastpage
42525
Abstract
The author introduces the material given in the guidelines to the NDE community. The guidelines are divided into three parts; general principles; technical considerations; and design rules. The first part, general principles, is for general application and includes much useful material for management on testability. The second part, on technical considerations, is product orientated and considers three areas; software, electronic devices and assemblies and electrical and electromechanical products and complex systems. In the third section, the testability is considered as an important issue in design, manufacture and in service; failure to consider it can have significant and potentially serious economic consequences; not least through product liability legislation
Keywords
electronic equipment testing; legislation; nondestructive testing; production testing; program testing; quality control; software engineering; IEE; NDT; assemblies; electrical products; electromechanical products; electronic devices; product liability legislation; production testing; quality assurance; software;
fLanguage
English
Publisher
iet
Conference_Titel
Non-Destructive Evaluation, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
208775
Link To Document