• DocumentCode
    2829953
  • Title

    Electrical evidence of disorder at the SiO2/4H-SiC MOS interface and its effect on electron transport

  • Author

    Swandono, S. ; Penumatcha, A. ; Cooper, J.A.

  • Author_Institution
    Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2012
  • fDate
    18-20 June 2012
  • Firstpage
    167
  • Lastpage
    168
  • Abstract
    Silicon carbide Schottky diodes have been in commercial production since 2002, their use has saved about $2B in energy and prevented about 10M tons of CO2 from being released into the atmosphere worldwide, equivalent to taking 1.7M automobiles off the roads. Recently, SiC power DMOSFETs entered commercial production, ushering in a new era of opportunity for wide bandgap power electronics. Going forward, high-voltage SiC MOSFETs and IGBTs hold the key to more efficient energy utilization and renewable energy production.
  • Keywords
    Schottky diodes; insulated gate bipolar transistors; power MOSFET; power electronics; silicon compounds; wide band gap semiconductors; IGBT; MOS interface; Schottky diodes; SiO-H-SiC; electrical evidence; electron transport; power DMOSFET; wide bandgap power electronics; Dispersion; Electric potential; Electron mobility; Interface states; Silicon; Silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2012 70th Annual
  • Conference_Location
    University Park, TX
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4673-1163-2
  • Type

    conf

  • DOI
    10.1109/DRC.2012.6257045
  • Filename
    6257045