DocumentCode
2829953
Title
Electrical evidence of disorder at the SiO2 /4H-SiC MOS interface and its effect on electron transport
Author
Swandono, S. ; Penumatcha, A. ; Cooper, J.A.
Author_Institution
Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
fYear
2012
fDate
18-20 June 2012
Firstpage
167
Lastpage
168
Abstract
Silicon carbide Schottky diodes have been in commercial production since 2002, their use has saved about $2B in energy and prevented about 10M tons of CO2 from being released into the atmosphere worldwide, equivalent to taking 1.7M automobiles off the roads. Recently, SiC power DMOSFETs entered commercial production, ushering in a new era of opportunity for wide bandgap power electronics. Going forward, high-voltage SiC MOSFETs and IGBTs hold the key to more efficient energy utilization and renewable energy production.
Keywords
Schottky diodes; insulated gate bipolar transistors; power MOSFET; power electronics; silicon compounds; wide band gap semiconductors; IGBT; MOS interface; Schottky diodes; SiO-H-SiC; electrical evidence; electron transport; power DMOSFET; wide bandgap power electronics; Dispersion; Electric potential; Electron mobility; Interface states; Silicon; Silicon carbide;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2012 70th Annual
Conference_Location
University Park, TX
ISSN
1548-3770
Print_ISBN
978-1-4673-1163-2
Type
conf
DOI
10.1109/DRC.2012.6257045
Filename
6257045
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