An efficient ellipsoidal scheme for design centering and constraint region approximation

A method for constraint region approximation, design centering and yield estimation is introduced. At the first stage, extreme points of the constraint region are identified by inscribing into it the largest possible ellipsoid. Design centering is performed simultaneously. The number of circuit simulations depends linearly on the number of design variables. Due to a relatively large number of optimization variables, the method has a good convergence rate. Ellipsoidal, polytope and second order Taylor series approximation schemes are presented, An example for testing the method is included