DocumentCode
283053
Title
Strong scatters and 1-D Born inversion
Author
Bond, L.J. ; Zhang, H.
Author_Institution
Dept. of Mech. Eng., Univ. Coll. London, UK
fYear
1988
fDate
32204
Firstpage
42522
Lastpage
42525
Abstract
The 1-D born Inversion technique is well established as a method which gives defect radii from pulse-echo ultrasonic measurements. Recent developments have provided a robust sizing technique for weak scatterers that gives the diameter of a flaw from measurements in the Born Radius/Zero-of-Time Shift Domain (BR/ZOTSD) without the explicit need to select a correct zero-of-time for the inversion. The paper reports some aspects of the extension of this work to consider the sizing of strong scatterers such as spherical voids and inclusions
Keywords
flaw detection; ultrasonic materials testing; 1-D Born inversion; Born Radius/Zero-of-Time Shift Domain; defect radii; flaw detection; inclusions; pulse-echo ultrasonic measurements; sizing technique; spherical voids; strong scatterers;
fLanguage
English
Publisher
iet
Conference_Titel
Digital Signal Processing and Display Techniques for Ultrasonics, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
208873
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