• DocumentCode
    283053
  • Title

    Strong scatters and 1-D Born inversion

  • Author

    Bond, L.J. ; Zhang, H.

  • Author_Institution
    Dept. of Mech. Eng., Univ. Coll. London, UK
  • fYear
    1988
  • fDate
    32204
  • Firstpage
    42522
  • Lastpage
    42525
  • Abstract
    The 1-D born Inversion technique is well established as a method which gives defect radii from pulse-echo ultrasonic measurements. Recent developments have provided a robust sizing technique for weak scatterers that gives the diameter of a flaw from measurements in the Born Radius/Zero-of-Time Shift Domain (BR/ZOTSD) without the explicit need to select a correct zero-of-time for the inversion. The paper reports some aspects of the extension of this work to consider the sizing of strong scatterers such as spherical voids and inclusions
  • Keywords
    flaw detection; ultrasonic materials testing; 1-D Born inversion; Born Radius/Zero-of-Time Shift Domain; defect radii; flaw detection; inclusions; pulse-echo ultrasonic measurements; sizing technique; spherical voids; strong scatterers;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Digital Signal Processing and Display Techniques for Ultrasonics, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    208873